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| ÇöÀçÀ§Ä¡ : HOME > PRODUCT > »ê¾÷¿ëÇ÷¡½Ãµð½ºÅ© >IDE Flash Disk |
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| ASAN ST's 1.8", 2.5" and 3.5" Form Factor Flash Disk Drives are based on a low power design using flash memory as the storage media. Since there are no moving parts or batteries that require maintenance, IDE Flash Disk Drives provide reliable operation in conditions that can be normally hostile to data. The solid-state components design means that there are no seek errors even under extreme shock and vibration. IDE Disk Drives can operate in 3.3V or 5.0V Systems. They have a standard 44-pin IDE interface which makes it an easy replacement for a hard disk drive. Mean Time Between Failure(MTBF) is an astonishing 1,000,000 hours. It is a perfect choice of solid-state mass-storage drive for industrial control systems, telecommunications and equipment that must function remotely. |
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| Feature |
Function |
Description |
| Physical |
Form Factor/Capacity |
1.8"(16MB~1.5GB), 2.5"(16MB~2.GB), 3.5"(16MB~2GB) |
| IDE Interface Command |
Meets ATA-4 (PIO mode 0 ~ 4) |
Power
Requirements |
Input Voltage |
5 Vdc (¡¾10%) |
| Performance |
Access Time |
< 0.1ms |
Track to track seek time
|
< 0.1ms |
Bus transfer speed
|
16.7Mbytes/Sec. |
Environmental
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Operating Temperature |
-10 to 70¡É( Storage Temperature : -25¡ÆC ~ 85¡ÆC) |
| Humidity |
5 to 95% (Non-Condensing) |
| Shock |
1,000G Max. |
| Vibration |
15G peak-to-peak max. |
| Acoustic Noise |
0dB |
| Altitude |
-1,200 to 120,000 feet |
| Reliability |
MTBF |
> 1.0 Million Hours @ Bellcore issue 6, Method I, Case 3 |
| Data Reliability |
Built-in EDC/ECC function |
| Endurance(Typical) |
Write/Erase: 1 Million cycles
Read : Unlimited |
| Security Erase Compliance |
NISPOM DoD 5220.22-M, NSA 130.-2, Air Force AFSSI 5020, Army 380-19, Navy NAVSOP-5239-26 |
| Diagnostics |
Built-in Power-up Self Tets. Self-monitoring Diagnostics Database |
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ELK-FDAB-XXXX
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AB : Form Factor(25 ¢Ñ 2.5", 35 ¢Ñ 3.5"), XXXX: Capacity(0016 ¢Ñ 16MB, 0032 ¢Ñ 32MB) |
All specifications within this document are subject to change without notice. |
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